Reliability of VO2-Based mmWave Switches Article is Published in IEEE TDMR

Our new work on the reliability of VO2-based mmWave switches is recently published in the IEEE Transactions on Device and Materials Reliability. This study investigates the performance and reliability of vanadium dioxide (VO2) thin film shunt switches integrated with coplanar waveguide (CPW) in the mmWave frequency range of 35-45 GHz. Remarkably, even after subjecting the switches to 100 million cycles of thermal cycling, statistical analysis showed no degradation in the electrical properties of the VO2 switches.

Citation: S. Chen, M. Lust, A. Roo and N. Ghalichechian, “Reliability of VO2-Based mmWave Switches Under 100 Million Thermal Cycles,” in IEEE Transactions on Device and Materials Reliability, vol. 23, no. 2, pp. 241-248, June 2023, doi: 10.1109/TDMR.2023.3249771.